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2000ApJ...536L.113G - Astrophys. J., 536, L113-L115 (2000/June-3)

Interferometric measurement of resonance transition wavelengths in C IV, Si IV, Al III, Al II, and Si II.


Abstract (from CDS):

We have made the first interferomeric measurements of the wavelengths of the important ultraviolet diagnostic lines in the spectra C IV near 155 nm and Si IV near 139 nm with a vacuum ultraviolet Fourier transform spectrometer and high-current discharge sources. The wavelength uncertainties were reduced by 1 order of magnitude for the C IV lines and by 2 orders of magnitude for the Si IV lines. Our measurements also provide accurate wavelengths for resonance transitions in Al III, Al II, and Si II.

Abstract Copyright:

Journal keyword(s): Atomic Data - Methods: Laboratory - Techniques: Spectroscopic

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