SIMBAD references

Characteristics of the astrophysical important Stark broadened 447.15nm, 587.56nm and 667.82nm HeI spectral line profiles have been measured at electron densities between 0.3x10²² and 8.2x10²²m^–3 and electron temperatures between 8000 and 33000K in plasmas created in five various discharge conditions using a linear, low-pressure, pulsed arc as an optically thin plasma source operated in a helium-nitrogen-oxygen gas mixture. On the basis of the observed asymmetry of the line profiles we have obtained their ion broadening parameters (A) caused by influence of the ion microfield on the line broadening mechanism and also the influence of the ion dynamic effect (D) on the line shape. Our A and D parameters represent the first data obtained experimentally by the use of the line profile deconvolution procedure. We have found stronger influence of the ion contribution to these HeI line profiles than the semiclassical theoretical approximation provides. This can be important for some astrophysical plasma modeling or diagnostics.