2016A&A...588A..70B

An excess of X-ray emission below 1keV, called soft excess, is detected in a large fraction of Seyfert 1-1.5s. The origin of this feature remains debated, as several models have been suggested to explain it, including warm Comptonization and blurred ionized reflection. In order to constrain the origin of this component, we exploit the different behaviors of these models above 10keV. Ionized reflection covers a broad energy range, from the soft X-rays to the hard X-rays, while Comptonization drops very quickly in the soft X-rays. We present here the results of a study done on 102 Seyfert 1s (Sy 1.0, 1.2, 1.5 and NLSy1) from the Swift BAT 70-Month Hard X-ray Survey catalog. The joint spectral analysis of Swift/BAT and XMM-Newton data allows a hard X-ray view of the soft excess that is present in about 80% of the objects of our sample. We discuss how the soft-excess strength is linked to the reflection at high energy, to the photon index of the primary continuum and to the Eddington ratio. In particular, we find a positive dependence of the soft excess intensity on the Eddington ratio. We compare our results to simulations of blurred ionized-reflection models and show that they are in contradiction. By stacking both XMM-Newton and Swift/BAT spectra per soft-excess strength, we see that the shape of reflection at hard X-rays stays constant when the soft excess varies, showing an absence of link between reflection and soft excess. We conclude that the ionized-reflection model as the origin of the soft excess is disadvantaged in favor of the warm Comptonization model in our sample of Seyfert 1s.